[NFC] Reduce fragility of swdev503538-... test. (#176302)
The original test was created in PR #120815, but it depends on -O0 and implicitly uses DAGCombiner (that is switched on by default for -O0). The patch reduces fragility of the test and removes dependency on DAGCombiner.
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@ -11,8 +11,8 @@
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define i32 @move_to_valu_assert_srd_is_physreg_swdev503538(ptr addrspace(1) %ptr) {
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entry:
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%idx = load i32, ptr addrspace(1) %ptr, align 4
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%zero = extractelement <4 x i32> zeroinitializer, i32 %idx
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%alloca = alloca [2048 x i8], i32 %zero, align 8, addrspace(5)
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%mask = and i32 %idx, 0
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%alloca = alloca [2048 x i8], i32 %mask, align 8, addrspace(5)
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%ld = load i32, ptr addrspace(5) %alloca, align 8
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call void @llvm.memset.p5.i32(ptr addrspace(5) %alloca, i8 0, i32 2048, i1 false)
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ret i32 %ld
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