Another issue unearthed by D127115
We take a long time to canonicalize an insert_vector_elt chain before being able to convert it into a build_vector - even if they are already in ascending insertion order, we fold the nodes one at a time into the build_vector 'seed', leaving plenty of time for other folds to alter it (in particular recognising when they come from extract_vector_elt resulting in a shuffle_vector that is much harder to fold with).
D127115 makes this particularly difficult as we're almost guaranteed to have the lost the sequence before all possible insertions have been folded.
This patch proposes to begin at the last insertion and attempt to collect all the (oneuse) insertions right away and create the build_vector before its too late.
Differential Revision: https://reviews.llvm.org/D127595
If the mask is made up of elements that form a mask in the higher type
we can convert shuffle(bitcast into the bitcast type, simplifying the
instruction sequence. A v4i32 2,3,0,1 for example can be treated as a
1,0 v2i64 shuffle. This helps clean up some of the AArch64 concat load
combines, along with helping simplify a number of other tests.
The PowerPC combine for v16i8 splat vector loads needed some fixes to
keep it working for v16i8 vectors. This improves the handling of v2i64
shuffles to match too, hopefully improving them in general.
Differential Revision: https://reviews.llvm.org/D123801
Currently isReallyTriviallyReMaterializableGeneric() implementation
prevents rematerialization on any virtual register use on the grounds
that is not a trivial rematerialization and that we do not want to
extend liveranges.
It appears that LRE logic does not attempt to extend a liverange of
a source register for rematerialization so that is not an issue.
That is checked in the LiveRangeEdit::allUsesAvailableAt().
The only non-trivial aspect of it is accounting for tied-defs which
normally represent a read-modify-write operation and not rematerializable.
The test for a tied-def situation already exists in the
/CodeGen/AMDGPU/remat-vop.mir,
test_no_remat_v_cvt_f32_i32_sdwa_dst_unused_preserve.
The change has affected ARM/Thumb, Mips, RISCV, and x86. For the targets
where I more or less understand the asm it seems to reduce spilling
(as expected) or be neutral. However, it needs a review by all targets'
specialists.
Differential Revision: https://reviews.llvm.org/D106408
Currently isReallyTriviallyReMaterializableGeneric() implementation
prevents rematerialization on any virtual register use on the grounds
that is not a trivial rematerialization and that we do not want to
extend liveranges.
It appears that LRE logic does not attempt to extend a liverange of
a source register for rematerialization so that is not an issue.
That is checked in the LiveRangeEdit::allUsesAvailableAt().
The only non-trivial aspect of it is accounting for tied-defs which
normally represent a read-modify-write operation and not rematerializable.
The test for a tied-def situation already exists in the
/CodeGen/AMDGPU/remat-vop.mir,
test_no_remat_v_cvt_f32_i32_sdwa_dst_unused_preserve.
The change has affected ARM/Thumb, Mips, RISCV, and x86. For the targets
where I more or less understand the asm it seems to reduce spilling
(as expected) or be neutral. However, it needs a review by all targets'
specialists.
Differential Revision: https://reviews.llvm.org/D106408
This test didn't include all test check lines, thanks to .'s in function
names. It also changed the triple to hard float to make a more
interesting test for NEON code generation.
D107068 fixed the same problem on aarch64 but the arm variant wasn't exposed in existing test coverage.
I've copied the arm64-neon-copy tests (and stripped the intrinsic test from it) for testing on arm neon builds as well.
