llvm-project/clang/test/SemaObjC/class-bitfield.m
Aaron Ballman aefd6c615c Combine two diagnostics into one and correct grammar
The anonymous and non-anonymous bit-field diagnostics are easily
combined into one diagnostic. However, the diagnostic was missing a
"the" that is present in the almost-identically worded
warn_bitfield_width_exceeds_type_width diagnostic, hence the changes to
test cases.
2021-07-14 11:43:28 -04:00

38 lines
1008 B
Objective-C

// RUN: %clang_cc1 %s -fobjc-runtime=macosx-fragile-10.5 -fsyntax-only -verify
@interface X
{
int a : -1; // expected-error{{bit-field 'a' has negative width}}
// rdar://6081627
int b : 33; // expected-error{{width of bit-field 'b' (33 bits) exceeds the width of its type (32 bits)}}
int c : (1 + 0.25); // expected-error{{integer constant expression must have integer type}}
int d : (int)(1 + 0.25);
// rdar://6138816
int e : 0; // expected-error {{bit-field 'e' has zero width}}
}
@end
@interface Base {
int i;
}
@end
@interface WithBitFields: Base {
void *isa; // expected-note {{previous definition is here}}
unsigned a: 5;
signed b: 4;
int c: 5; // expected-note {{previous definition is here}}
}
@end
@implementation WithBitFields {
char *isa; // expected-error {{instance variable 'isa' has conflicting type: 'char *' vs 'void *'}}
unsigned a: 5;
signed b: 4;
int c: 3; // expected-error {{instance variable 'c' has conflicting bit-field width}}
}
@end